NASA/ARC is hereby soliciting information about potential sources for AFM Scanning Probe Spectrometer which will be used for identification of small molecules by Raman spectroscopy. NASA/ARC intends to purchase this item from the following company: Nano Technologies-America, 313 South Jupiter Road, Suite 105, Allen, TX 75002 pursuant to FAR 6.302-1. Nano Technologies-America has a unique ability to enable efficiently the identification of small molecules by Raman spectroscopy and surface feature resolution by Atomic Force Microscopy (AFM). Nano Technologies-America can also provide efficient and reproducible measurements of Raman imaging down to 40nm on transparent samples in both back-scattered light collection, including TERS using illumination objective and upright light collection using independent objectives or SNOM probe. This device is an upgrade to the existing Nano Technology-America Scanning Probe Microscope which was recently purchased so, in the best interest of the Government that Nano Technologies America supply this AFM Scanning Probe Spectrometer to NASA/Ames Research Center. The specifications are as follows: 1) Enable efficient identification of small molecules by Raman spectroscopy on transparent samples and surface feature resolution by Atomic Force Microscopy (AFM) 2) Enable efficient and reproducible measurements of Raman imaging down to 40 nm on transparent samples in both back-scattered light collection, including TERS using illumination objective and upright light collection using independent objective or SNOM probe 3) Capability of replacing the AFM measuring head with a SNOM measuring head 4) Integrated software for operation with both AFM and SNOM heads. 5) Capable of operating in integration with the inverted optical microscope (Olympus or Nikon) and as a stand-alone system, in which case it should have the capability of incorporating an optical objective in the device with the possibility to adjust the objective position in Z direction (100 micron) independently of the AFM XYZ stage. 6-Option of upgrade to scan-by-probe measuring AFM head with noise level of XY<0.2nm and Z<0.04 nm The Government does not intend to acquire a commercial item using FAR Part 12. All responses shall be submitted to Patricia Finnell-Mendoza no later than 4:30 PM PST on 07/25/2006. Responses may be mailed to the following address: NASA AMES RESEARCH CENTER Attn: Patricia Finnell-Mendoza M/S 241-1 Moffett Field, CA 94035-1000. Please reference NNA06164393P-PFM in any response. Such capabilities will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the government. Oral communications are not acceptable in response to this notice. All responsible sources may submit an offer which shall be considered by the agency. An Ombudsman has been appointed. See NASA Specific Note "B". Any referenced notes may be viewed at the following URLs linked below.

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