BSA has a requirement for a Combination Confocal Microscopy System, designed for a number of seamlessly integrated scanned probe microscopy and optical microscopy modes. It shall operate in air or in controlled atmosphere at room temperature, as well as at variable temperatures above room temperature. The option of operating in liquid environments will be regarded as a plus. As a future multi-user instrument at BNL¡¦s Center for Functional Nanomaterials, the system shall be simple to operate and reasonably rugged, and allow users to access powerful microscopy and spectro-microscopy modes after minimal training. The system shall be self-contained and include all necessary components for operation in AFM, SNOM, CM, and Raman imaging modes. Switching between these different microscopy modes shall be simple and fast, and shall maintain a small (few ƒÝm) region of interest on the sample in the field of view to allow imaging of the same sample area in different modes. This, acquisition, is a, ¡§Best Value¡¨, procurement. The utilization of this procedure is expected to provide the greatest overall benefit to BSA/BNL. ¡§Best Value¡¨ employs a trade off process that permits award to other than the lowest priced offeror or to the highest technically rated offeror. The tradeoff process, associated with Best Value involves a comparative weighing of the evaluation factors and sub-factors identified in the Request for Proposals (RFP). Specifically, the trade off process involves selecting the most advantageous offer based upon an integrated assessment of both non-cost/price factors, taken in their assigned relative importance. The following factors, in their relative order of weighting, will be utilized to evaluate the offers: Combination Confocal Microscope Technical Specification Compliance 1. General 2.0 Combination Microscope System 2.1 General Instrument Specifications (all operating modes) 2.2 Atomic Force Microscopy (AFM) 2.3 Scanning Near-Field Optical Microscopy (SNOM) 2.4 Confocal Microscopy (CM) 2.5 Confocal Raman Microscopy (CRM) 2.6 Combination Microscope: Control Electronics, Computer & Software 3.0 Expansion Capabilities 4.0 System Support 5.0 Performance Risk Proposals are due April 20, 2007 by 4:00 PM, EDT, and shall be submitted to Brookhaven Science Associates, Brookhaven National Laboratory, Attention: D. Paveglio, Bldg. 355, Upton, NY 11973, by US mail. This RFP has been sent to the following known manufacturers: WITEC Instruments All other interested manufacturers may download RFP CM116262 from this website.

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