This requirement is for AFM Controller with Multimode 8 head, Peak Force TUNA and SCM modules for our Nanoscope Multimode IIIa Atomic Force Microscope (AFM). The updated AFM system must be fully Multimode 8 compatible, including the scanner head. Includes two days installation and training for the new systems. The AFM Controller is an essential part of the AFM, which provides measurement capabilities required for funded research and student education at the Air Force Institute of Technology. This equipment is capable of characterizing a variety of surface topography, electrical, thermal and mechanical properties of aerospace materials at nanometer scales.

Specifications are as follows:

MULTIMODE8 UPGRADE
Configured as follows:
CONFIGURED SYSTEM:
MULTIMODE8-U-NSV - MULTIMODE8-U UPG PKG INCL NSV
V8-compatible Upgrade to an Existing MultiMode SPM without an
Existing NanoScope V Control Station
-- For a MultiMode SPM without an existing NanoScope V Control
Station, this upgrade provides a new V8-compatible NanoScope V
Control Station, MultiMode base electronics upgrade, 37 pin adapter
(Model 37PA) and a 30-inch LCD monitor.
-- Recommended MultiMode upgrades include Model MMLNQU for
Q-control capability or a new head, Model TVOH-MULTIMODE, for both
Q control and application module capability
-- Enables operation of our exclusive ScanAsyst Mode using exclusive
Peak Force Tapping technology, including automatic image optimization
technology
-- REQUIRES return of certain existing AFM hardware following
NanoScope V installation. Items to be returned include the NanoScope
controller and Digital Signal Processor (DSP or DSI) board from the
existing Control Station controller (Models E, II, III, IIIa, IV or IVa) plus
the Extender Electronics Module (Models PHASE-01, PHASE-R,
QUADREX) if AFM system is equipped with PHASE. Contact Customer
Service for RMA number for return paperwork. If controller is not
returned within 30 days following upgrade installation, the customer will
be invoiced the full price of the NanoScope V Control Station.
-- REQUIRES Model UNIVECPOT for Electrochemistry (NOT compatible
with the older Electrochemistry AFM/STM Converter Base for the
MultiMode SPM, Model MMECAFM)
-- REQUIRES cable clamp Model VT-103-CC-UNIV if upgrading the
NanoScope Control Station for a MultiMode SPM currently housed in an
older VT-103-MM-X Integrated Acoustic/Vibration Isolation hood
-- REQUIRES a minimum of one-day installation/training (Model
ITCS1-SRV) that must be purchased separately
-- NOTE: 1) NOT compatible with obsolete MultiMode predecessor
AFM/LFM models
MONITORS:
MONITOR - FACTORY SUPPLIED MONITOR

MM8-PFTUNA
PeakForce TUNA Application Module for MultiMode8
-- High bandwidth, high gain, low noise module with user selectable gain
settings that enables exclusive PeakForce TUNA mode
-- Also enables TUNA, TR-TUNA, and CAFM
PeakForce TUNA Mode
-- Measures ultra-low currents between probe tip and sample as probe is
scanned over the sample.
-- Operates in PeakForce Tapping mode with direct force control and minimal
lateral forces. Thus avoids the artifacts stemming from probe and sample
damage and retains highest spatial resolution. This enables use on soft, fragile,
or loosely bound samples that are likely to be damaged by contact mode.
Measures both, peak current and cycle averaged current.
-- Includes Bruker's proprietary ScanAsyst automated scan optimization.
-- Includes Bruker's proprietary PeakForce QNM for directly correlated
nanomechanical information. PeakForce QNM allows quantitative mapping of
nano-mechanical properties including elastic modulus, adhesion, deformation,
and dissipation, while simultaneously imaging sample topography at high
resolution.
Includes 6 gain settings ranging from 100nA/V to 20pA/V. Achieves >10kHz
bandwidth for peak current detection at highest amplifier gain setting, which at
the same time provides sub-100fA noise level in the cycle averaged current
under imaging conditions.
-- A bias of mV to 10V can be applied.
TUNA Mode
-- Measures ultra-low currents between the probe tip and a sample (typically
covered with a thin dielectric film) as the probe is scanned over the sample
-- Images variations in quality/integrity of thin dielectric films by measuring the
tunneling current, including variations in film thickness, location of electrical
defects, and other characteristics
-- Current is measured using an ultra-low current amplifier with 3 gain settings
ranging from 1nA/V to 20pA/V. Provides typical noise level below 100fA at
highest gain under imaging bandwidth.
-- A bias of mV to 10V can be applied
TR TUNA Mode
-- TR TUNA uses torsional resonance feedback. This reduces both vertical and
lateral forces on samples, which enables TR TUNA to be used on soft samples
otherwise likely to be damaged by contact mode (e.g. polymers) or on loosely
bound samples likely to be disrupted by contact mode (e.g. nanowires).
-- Current is measured using an ultra-low current amplifier 3 gain settings
ranging from 1nA/V to 20pA/V. Provides typical noise level below 100fA at
highest gain under imaging bandwidth.
CAFM Mode
-- Measures low-level currents between the probe tip and a sample as the
probe is scanned over the sample
-- Images variations in conductivity and quality/integrity of conductive samples
by measuring the current. CAFM is used for measuring variations in film
thickness, location of electrical defects, and other characteristics.
-- Current is measured using a low current amplifier with 3 gain settings
ranging from 100nA/V to 2nA/V.
-- A bias of mV to 10V can be applied
Additional Information
-- Package includes Application Module, software and cantilever holder and one
10-pack of PFTUNA probes
-- Includes one additional day on-site installation/training when purchased with
any other on-site installation/training package (Models ITCS, ITCS1-SRV or
ITCS3)
-- If purchased separately, customer must also purchase one day of
installation/application training (Model ITCS1-SRV)
-- CE compliant
-- REQUIRES a MultiMode8 SPM with application module ready optical head.
-- NOTE: An acoustic/vibration isolation system is strongly recommended
Top-view Optical Head for Existing MultiMode SPMs
-- Standard or Application Module Top-view Optical Head for on-axis viewing
of probe and sample (select type when ordering)
-- Included with the MultiMode SPMs but available as a replacement part
-- Provides upgraded head electronics for lowest possible noise and cleanest
possible images when imaging in Q control with a Quadrex-enhanced
NanoScope Control Station
-- Includes one Electric Field Cantilever Holder (Model MMEFCH) with
Application Module Optical Head
-- REQUIRES Application Module-ready electronics and PHASE or
QUADREX-enhanced Control Station for Application Module Optical Head
-- REQUIRES serial number of existing MultiMode SPM on Bruker price
quotation and on customer PO
-- NOTE: Application Module Optical Head is NOT compatible with obsolete
MMAH Series Atmospheric Hoods for the MultiMode, but is compatible with
new MMAH2 Series
Configured as follows:
HEAD:
MM-AM - MULTIMODE SPM AM HEAD
125 x 125-micron Vertical Engage Leak Resistant AFM Scanner
-- 125-micron x 125-micron scan size; 5.0-micron vertical range
-- Includes single-tube piezoelectric tube scanner with three-point support for
microscope head
-- Includes calibration rulings
-- Scan sizes listed are nominal maxima for piezo drives of ±220V (standard
on all NanoScope models)
-- Designed for vertical motion, eliminating tilt and lateral movement of the
cantilever during engage. Fully motorized and requires no manual adjustments
-- Offers increased resistance against damage caused by fluid
-- Includes a 4-year warranty covering damage caused by fluid during normal
use
Video-only Microscope System
-- Compatible with all current MultiMode 8 and MultiMode-NS3D configurations
-- Allows optical imaging simultaneous with MultiMode operation
-- 10X Nikon objective (WD = 49.5mm; NA = 0.2; and resolution of
1.6-micron)
-- Erect image (the optical image is not inverted horizontally or vertically)
-- 12.7mm travel two-axis stage positions the MultiMode under the microscope
-- Maximum field of view approximately 400x500 microns. Digital zoom levels
at 2X, 4X, and 8X.
-- High performance 5MP digital camera with USB interface
-- All cables and other accessories included
-- Fiber coupled illuminator (CE compliant, auto-switching for worldwide power
voltages)
-- NOTE: Video image is displayed within the NanoScope software for
MultiMode 8 systems and in a standalone software application for systems
with NanoScope 3D controllers.
-- NOTE: Optional 5X objective (NIKON5X) is required for compatibility with
MultiMode environmental hoods (MMAH2-series accessories).
-- NOTE: Consult factory for compatibility with obsolete MultiMode systems.
Due to USB camera interface, requires a computer with Windows XP.
Sample Kit for PeakForce QNM
-- Includes one each of PDMS-SOFT-1, PDMS-SOFT-2, PSFILM, HOPG-15M,
FSILICA, SAPPHIRE-15M, RS-15M, and PS-LDPE samples
-- NOTE: While formulated for stability, the supplied samples may change with
aging
Cantilever Holder for Scanning in Fluid (TappingMode, Force Modulation) with
the MultiMode SPM
-- Glass cantilever holder for fluid operation for contact mode, TappingMode,
and Force Modulation. The cantilever is acoustically driven by a separate
piezo oscillator for larger amplitude modulation.
-- Includes 10 Oxide-Sharpened Silicon Nitride NanoProbes (SNL-10)
recommended for soft samples
-- NOTES: 1) Updated design now securely holds new silicon nitride probes
from Bruker Nano Probes that have thinner substrate chips; 2) This replaces
the contact-only fluid cell, Model FC.

This notice of intent is not a request for competitive quotations; however, any quotation received within five (5) days of the issuance of this notice will be considered by the government. A determination by the government not to compete this proposed contract based upon responses to this notice is solely within the discretion of the government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement. Any quotations should be e-mailed to [email protected] no later than 1:00 p.m., Eastern Standard Time, 21 Nov 2011. Only proposals received by this date will be considered. Any questions should be directed to Robert Neeb at 937-522-4547.