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Award Info Published Wednesday October 1, 2014 Awarded to: Vendor: Bruker Nano Inc., Santa Barbara, CA Amount: $214,205 Terms: One-time transaction The University award process may be delayed up to thirty days as this award goes through a state approval process. The hearing has been cancelled Published Tuesday September 16, 2014 The hearing has been cancelled since no vendors registered to attend or submitted comments regarding this notice. First published Tuesday, September 2, 2014 The University awarded a contract for Bruker's Atomic Force Micrscope System to Bruker Nano Inc., Santa Barbara, CA, for $214,205. Purchase of Bruker Nano Dimension Icon Atomic Force Micrscope System as no other source meet's the researcher's documented needs. There are four critical patents that Bruker has for this technology that describe the most unique aspects: 1. The Bruker Icon features a proprietary automatic image optimization technology (ScanAsyst; U.S. Patent #8,646,109) that adjusts image parameters using intelligent algorithms. This reduces user operating time and system maintenance due to reduced operator error damages. 2. The Bruker system incorporates a proprietary mode called PeakForce Tapping imaging (PFT, U.S. Patent #8,739,309), which provides direct force control down to 50 picoNewtons. 3. Bruker has Quantitative Nanomechanical Mapping (QNM) as an imaging mode (U.S. Patent #8,650,660). Quantitative Nanomechanical Mapping (QNM) provides modulus, adhesion, sample deformation and energy dissipation data channels in real time and at high resolution. This capability is unique to Bruker. Polymer/composite research would definitely benefit from modulus and adhesion mapping. Also, QNM can be used to map the mechanical properties of very soft materials such as live cells, where measurements have been taken down to 25 kiloPascals. Our facility must serve the biomedical community and therefore the ability to obtain measurements on biological and live samples is essential using QNM. 4. Bruker's proprietary "Lift Mode" (U.S. Patent #5,418,363) is the only effective method that can eliminate topography artifacts from Magnetic Force Microscopy data. At great time and expense, UIC researchers have been forced to travel to Northwestern University to use the Bruke Dimension Icon AFM there. Purchasing this system for our facility insures the compatibility of data for UIC faculty and research collaborators at Northwestern. The University has determined that this purchase is only economically available from this source because the item or service is copyrighted or patented and is not available except from the holder of the copyright or patent. For additional information, contact: John Meehan University of Ilinois at Chicago Purchasing Division (M/C 560) 809 South Marshfield Avenue Chicago, IL 60612-7203 Phone: (312) 413-5961 FAX: (312) 996-2055 Purchasing Website State Purchasing Officer - Aaron M. Finder We will hold a public hearing at the date, time and location specified below, if we receive a request to testify regarding the sole source determination. We will also hold a hearing if any vendor submits a signed statement showing the capability to provide the stated supplies/services at or below the amount indicated. The public hearing allows any interested party the opportunity to testify for or against the sole source determination as described in this notice. The purpose of the hearing is to receive information from the public in a reasonable manner. Formal rules of evidence will not apply. The hearing officer will produce minutes of the hearing and may record it in order to aid in the production of the minutes. After conclusion of the hearing we will decide whether the sole source determination was appropriate. We must receive any request to testify and any vendor statement no later than the registration date and time indicated below. If we do not receive a timely request or statement, we will not hold the hearing. We reserve the right to cancel the procurement prior to any scheduled hearing. Please confirm the status of the hearing with the Hearing Contact. Hearing Details Date: September 17, 2014 Time: 2:00 PM Location: Stratton Building Room 511 401 S. Spring Street Springfield, IL If you cannot attend the meeting in-person at the primary location, you may attend via audio or video conference, as available, at one of the optional locations. Alternate Location(s): James R. Thompson Center Room 9-035 100 West Randolph Chicago, IL Hearing Contact: Keely Burton Phone:(217) 558-5143 Fax:(217) 558-5407 E-mail:[email protected] Date, time, and location are subject to change and/or cancellation. It is the responsibility of potential participants to confirm these details prior to attendance. Registration Registration Deadline: September 12, 2014 Register with: Keely Burton Phone:(217) 558-5143 Fax:(217) 558-5407 E-mail:[email protected]

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