CNST requires an electron column upgrade for two existing FEI Helios 650 focused ion beam scanning electron microscope (FIB SEM) to support nanofabrication and advanced 2D and 3D imaging. The proposed upgrades of the electron columns (H650 to H660) on the existing FEI Helios NanoLab 650 focused ion scanning beam scanning electron microscope (FIB SEM) systems will enable true back-scatter imaging of materials with large Z differentials such as metal catalyst in polymer nanocomposites and the ability to perform high current microanalysis with max current of 100nA.
FEI Helios NanoLab 650 FIB SEM system is designed, manufactured, and sold by FEI and FEI does not have any authorized resellers of their product; therefore, this upgrade can only be purchased from FEI. The proposed electron column upgrade from H650 to H660 requires adding two new in-column detectors, replacement of the pole-piece, and the replacement of integral instrument electronic components that require FEI proprietary design and manufacturing expertise.
The estimated completion for this project will be 120 days from award. The NAICS code is 334516 and size standard is 500 employees. This notice is not a request for competitive quotations. However, any firm that believes it can meet these requirements may submit a written response via email to Danielle Peña at [email protected] no later than 9:00 AM Eastern Time on Monday, March 16, 2015. Supporting evidence must be furnished in sufficient detail to demonstrate the ability to comply with the above requirement. Information received will be considered; however, a determination by the Government not to compete the proposed acquisition based on responses to this notice is solely within the discretion of the Government. If no responses are received, NIST will proceed with the sole source award to FEI Company, 5350 NE Dawson Creek Dr, Hillsboro, OR 97124-5793. The anticipated award date for this requirement is around May 1st. No phone calls will be accepted. If you have any questions regarding this announcement, please contact Danielle Peña at [email protected].