•Microprobe-for Wavelength Dispersive Spectroscopy (WDS) quantitative elemental analysis and mapping.
•Scanning Electron Microscope-for high resolution imaging, EDS, Electron Back Scattered Diffraction (EBSD) mapping for crystallographic orientation mapping, phase identification and texture in polycrystalline materials.
•Dual Beam Scanning Electron Microscope/Focused Ion Beam-for high resolution imaging, micromachining and in situ sample manipulation, "slice and view" serial sectioning and imaging, create TEM samples from bulk material, sample surface cross-sectioning, 3-D EBSD and 3-D EDS.
•X-ray Diffraction Laboratory-for structure analysis, thin film analysis, texture-macrostrain analysis, nanopowder characterization, in situ experimentation, Multivariate Analysis (MVA), neutron diffraction, high resolution powder X-ray Diffraction (XRD), X-ray Fluorescence (XRF) hyperspectral mapping.
•Analytical Chemistry Lab-for general analysis: UV-VIS Spectrophotometer, Titration, Density and Ion Chromatography. For inorganic analysis: Inductively Coupled Plasma/Atomic Emission Spectrometry (ICP/AES), Inductively Coupled Plasma/Mass Spectrometry (ICP/MS), combustion analysis (LECO) and Laser Ionization Breakdown Spectroscopy (LIBS). For organic analysis: Gas Chromatography (GC), GC Mass Spectrometry, High Performance Liquid Chromatography/Mass Spectrometry (HPLC/MS), Ultrahigh Performance Liquid Chromatography/High Resolution Mass Spectrometry (UPLC/MS), and CHN analysis.
•Surface Analysis Laboratory-for imaging and depth profiling for systematic, layer-by-layer bulk sample analyses, Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy/Ultraviolet Photoelectron Spectroscopy (XPS/UPS), Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), stylus profilometry (DEKTAK), Atomic Force Microscopy/Scanning Probe Microscopy (AFM/SPM), Near-Edge X-ray Absorption Fine Structure (NEXAFS), and imaging NEXAFS.
•Metallography Laboratory-for microstructural analysis, cross sectioning, macro and micro optical imaging, comprehensive image analysis, laser scanning confocal microscopy, and macro and micro hardness testing and mapping.
•Thermal-Mechanical Characterization-for thermal analysis, rheological testing, mechanical testing, portable data acquisition, Gel Permeation Chromatography (GPC), water diffusion and uptake, thermal-cycling in chambers, SolidWorks and COSMOSWorks software for computer-aided design (CAD) and FEA analysis.
Access to laboratories and instrumentation is provided through Sandia staff and technologists. Full cost recovery is required.
For more information visit http://info.sandia.gov/materials/sciences/materials-performance/materials-characterization.html or contact Jim Aubert by email at [email protected] .
Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S.Department of Energy's National Nuclear Security Administration under Contract DE-AC04-94AL85000. SAND #2014-4825P
Keywords: materials, characterization, research, development, failure analysis, structure, spectroscopy, composition, degradation, defects, imaging, mapping, profiling, rheological, permeation, thermal, mechanical, chemistry