SPECTROSCOPIC ELLIPSOMETER: The Operational Contracting Division, Wright Patterson AFB OH is seeking a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt and focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days ARO. This announcement constitutes the only solicitation; quotations are being requested and a written solicitation will not be issued. Solicitation Number FA8601-13-T-0272 is issued as a Request for Quotation (RFQ).

This requirement is total set aside for small businesses. The associated North American Industry Classification System (NAICS) Code is 339115. The size standard is 500 Employees. The Government is not liable for any costs and/or activity associated with providing a response to this announcement. Any cost incurred as a result of a response to this announcement shall be borne by the firm and will not be charge to the Government for reimbursement.

The FAR, DoD FAR Supplements (DFARS) and Air Force FAR Supplements (AFFARS) apply. It is the offeror's responsibility to be familiar with applicable clauses and provisions. FAR clauses can be viewed in full text through the internet FAR site: http://farsite.hill.af.mil .

The Offeror shall provide all labor, materials, equipment, transportation, and incidentals necessary for Spectroscopic Ellipsometer (1 EA) with the following requirements:
Auto Angle Base, minimum data acquisition time: approx.: 50 msec. typical data acquisition times 1-5 sec.; Collimated light beam (diameter varies with model: 2-5mm); Auto angle base ranging from 45 degrees to 90 degree, featuring horizontal sample stage; Automated sample height (Z) alignment; Operator Computer: Core is 2500 3.3GHz, 4GB RAM, 320GB HD, 16XDVD+/- RW drive, 19"FP display, Windows 7 Professional, Office Home and Business 2010.
Focusing optics which can detach for measurement with standard spot size
Camera-to view the light beam
Automated Sample Translation Upgrade 100x100mm XY Mapping
Automated Tip-Tilt Alignment
Automated Sample Rotation
Transmission Mount, Size: Small: samples <150mm diameter
Automated Variable Angle Transmission Stage
Table/Rack-Mount
Questions are due by2:00 p.m. Eastern Time on Sep 19, 2013 to:

Gwendolyn Brown, AFLCMC/PZIOBB
Fax: (937) 656-1412 (ATTN: Gwendolyn Brown)
Email: [email protected]

Be advised that all correspondence sent via e-mail shall contain a subject line that reads "FA8601-13-T-0272, Spectroscopic Ellipsometer." Note that email filters at WPAFB are designed to filter e-mails without subject lines or with suspicious subject lines or contents (i.e., .exe, or .zip files). Therefore, if this subject line is not included, the e-mail may not get through the e-mail filters at WPAFB. If sending attachments with e-mail ensure only .PDF, .doc, or .xls documents are sent. The e-mail filter may delete any other form of attachments.

Mail Address:

ATTN: Gwendolyn Brown
AFLCMC/PZIOBB
1940 Allbrook Drive, Suite 3
Wright Patterson AFB, OH 45433

 

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