G
Sole Source determination is based on the following: The general mission of the Materials Measurement Science Division at NIST is to provide research, reference materials, and data to support accurate and selective analysis of microscopic particles and surfaces including the spatial distribution of chemical species relevant to industrial, environmental, and biological processes. Nanoscale imaging and microanalysis of materials is one of the main research topics. The required upgrade of the electron column (H650 to H660) on the existing FEI Helios NanoLab 650 focused ion beam scanning electron microscope (FIB SEM) system will enable true back-scatter imaging of materials with large Z differentials such as metal catalyst in polymer nanocomposites and the ability to perform high current microanalysis with max current of 100 nA.
Due to the proprietary nature of this system, FEI Company is the only vendor capable of providing the required Helios 660 Upgrade in order to satisfy the Government's minimum requirements. FEI Company is the sole manufacturer and distributor.
The North American Industry Classification System (NAICS) code for this acquisition is 334516, and the size standard is 500 employees.
No solicitation package will be issued. This notice of intent is not a request for competitive quotations; however, the Government will consider responses received by July 22, 2014, 3:30 p.m. EST.
A determination by the Government not to compete the proposed acquisition based upon responses to this notice is solely within the discretion of the Government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement.